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AlN/NbN/AlN multi-layer for detector applications

AlN/NbN/AlN multi-layer for detector applications
Forschungsthema:Dünnschichttechnologie
Datum:ab sofort
Betreuer:

Dr. rer. nat. Konstantin Ilin
Dipl.-Ing. Michael Merker

Bearbeiter:

Markus Matura

AlN/NbN/AlN multi-layer for detector applications